integrated circuit testing meaning in Chinese
积体电路测试
Examples
- methods of expanding the element storehouse of integrated circuit test system
集成电路测试系统的元件库的扩充方法 - we have demonstrated that the integrated circuit test structures fabricated at standard commercial foundries can be radiation tolerant at total does greater than 100krad ( si ) . the radiation environment of outer space is capable of effecting cmos devices in three ways
外太空辐射环境主要以三种方式影响cmos器件：总剂量辐射效应(tid)，单粒子翻转效应(seu)和单粒子闩锁效应(sel)。 - in this study, the design procedures for mitigating radiation effects mechanisms have been implemented in a gate array design, we have obtained samples of integrated circuits test structures manufactured by wuxi csmc-hj using their 0.6-m cmos process
在研究中，我们将降低辐射效应的设计方法应用到门阵列设计中，获得了华晶上华半导体有限公司采用0.6m的cmos工艺生产的集成电路样片，具有100krad(si)的抗总剂量辐射能力。 - at present testing method based on current testing has become an important cmos digital integrated circuit testing method which has been accepted widely . in order to improve the fault coverage of the testing to meet the demands of people, the dynamic current ( iddt ) testing was proposed to detect some faults that cannot be detected by other testing methods in the middle 1990 ’ s
90年代中期,人们提出了瞬态电流测试方法(iddt),以便发现一些其他测试方法所不能发现的故障,进一步从总体上提高测试的故障覆盖率,满足人们对高性能集成电路的需要。